Author: JHA, NIRAJ K.; KUNDU, SANDIP
Title: Testing and Reliable Design of CMOS Circuits
Description: Boston, MA, U. S. A. Kluwer Academic Publishers. 1990, First Edition. (ISBN: 0792390563). hardcover. Used, Printed boards, no jacket. Exterior a little worn, grubby; previous owner's name on FEP; contents otherwise clean, sound, bright. TPW. Very Good/No Dust Jacket.

Keywords: 0792390563


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