Author: DAVID, RENE
Title: Random Testing of Digital Circuits : Theory and Application
Description: New York, NY, U.S.A. Marcel Dekker Inc. 1998, First Edition, First Printing. (ISBN: 0824701828). hardcover. Used, Hardcover and contents in almost new condition, showing minimal signs of wear. Previous owner's name on FEP. No dust jacket. T. Very Good/No Dust Jacket.

Keywords: 0824701828


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