Author: BEENKER, F. P.; THIJSSEN, A. P.; BENNETTS, R. G.
Title: Testability Concepts for Digital ICs : The Macro Test Approach
Description: Boston, Kluwer Academic Publishers. 1995. (ISBN: 0792396588). Hardcover. Used, Name from previous owner on FEP. No dust jacket. Binding is very well preserved, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Very Good/No Dust Jacket.

Keywords: 0792396588


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