Author: SAKURAI, TOSHIO; SAKAI, A.; PICKERING, H.W.
Title: Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics and Electron Physics. Supplement; 20)
Description: San Diego, California, U.S.A. Academic Press, Inc. 1989, First Edition, First Printing. (ISBN: 0120145820). hardcover. Ex-Library, Cover and contents in very good clean condition. Mild age spotting to top of page block. Library stamp on FEP, title page and BEP. Black cover with gilt lettering to spine and upper board. Very Good/No Dust Jacket.

Keywords: Solid State Physics Science 0120145820


See more books from our catalog: Science - Chemistry/Biochemistry/Physics