Author: WALKER, DUNCAN MOORE HENRY
Title: Yield Simulation for Integrated Circuits (The Kluwer International Series in Engineering and Computer Science)
Description: Lancaster, United Kingdom, Kluwer Academic Publishers. 1987, First Edition. (ISBN: 0898382440). Hardcover. Ex-Library, numerous figures, softening to head of spine, scrape on the bottom of spine, front and back cover, light bump to top corners of cover, FEP is torn off, text and illustrations clean and tight. Good/No Dust Jacket.

Keywords: Computers 0898382440


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