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Title: Semiconductor Measurement Technology: Method to Determine the Quality of Sapphire (NBS Special Publication 400-62)
Description: Washington D.C. U.S.A. US Department of Commerce / National Bureau of Standards. paperback. Sticker to front cover (spine edge) and inside cover. Some wear to cover edges / corners. Text is clean, tight and bright. 62 pages. Good/No Dust Jacket.

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