Author: Voelkl, E.; Piston, D.; Gauvin, R.; Lovckley, A.J.; Bailey, G.W.; Mckernan, S.; editors:
Title: Proceedings: Microscopy and Microanalysis 2002
Description: Cambridge, Cambridge University Press, 2002. orig.boards. 28x22cm, lxiii,480 pp, With a DVD in unopened rear-pocket.. Minor rubbing. VG. ¶ Series: Microscopy and Microanalysis, Volume 8, Supplement 2, 2002. Contains hundreds of papers concerning: Aberration Correction in TEM and STEM & Its Application to Real-World Materials; Image Simulation & Image Processing Techniques; Electron Holography, Interference Phenomena & Related Techniques; Applications & Developments of Focused Ion Beams; EELS & EFTEM Analysis; Frontiers of X-Ray Spectroscopy; Spectral Imaging; Electron Crystallography & Quantitative Electron Diffraction; Electron Backscatter Diffractioon of Materials: Geology to Nanotechnology; Current Topics in Low Voltage SEM; Electron Backscatter Diffraction in the SEM: Orientation Mapping & Phase Identification for Materials Science; New Developments in Immunolabelling; Microscopy, Microanalysis & Image Analysis in the Pharmaceutical industry; Advances in Microwave Technology; Biominerals; Scanning Probe Microscopy: Electron Cryo-Microscopy of Biological Macromolecules; The Nuts & Bolts of Electron Tomography; Biological Ultrastructure; Plant-Microbe Interactions at the Cellular & Molecular Levels; Microbiology; Cry-electron Microscopy of Large Complexes;Correlative Microscopy; Confocal & Deconvolution for Biologists; Advances in Nanoscale Technology; Modulated Structures in Quasicrystals; Polymer Characterization; Electron Microscopy of Macro-, Micro and Meso-Porous Materials; Magnetic Materials & Super-Conducting Matertials; Phase Transformation in Metals, Alloys & Ceramics; Quantitative X-Ray Analysis in the Microprobe & in the SEM; etc.

Keywords: Microanalysis, Electron Microscopy, Materials Science, Physics Engineering, Microbiology, Microbeam, Immunolabelling, Image Analysis, Scanning Probe