Author: AMERASEKERA, E.A., & CAMPBELL, D.S.
Title: Failure Mechanisms in Semiconductor Devices.
Description: Chichester: John Wiley & Sons, 1987. 1st ed. "All the major aspects of semiconductor device reliability receive coverage in this text." Pp. 13/205, figures and diagrams throughout, fep top corner clipped. Illustrated laminated boards. G+.

Keywords: Amerasekera Campbell Failure Mechanisms Semiconductor Devices 20673 Science


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