Author: JOHNSON, DALE E (EDITOR)
Title: Microscopy and Microanalysis: Vol 4, #3, May/June 1998
Description: Springer, 1998. Magazine. Includes 1998 ASU Electron Microscopy Works. Some of the articles: Ion Beam Interface with a 200 keV Transmission electron Microscope for In Situ Micropatterning on Semicondutors; Time-Resolved High-Resolution Transmission Electron Microscopy using a Piezo-Driving Specimen Holder for Atomic-Scale; High Temp in Situ Strianing Experiments; Interphase Boundary Dynamics; Nanoparticle Sintering by Plan-View; Ostwarld Ripening of Germanium Island on Silicon; Melting of Aluminum Particles; Formation of nanocrystalline TiC from TiO2, etc. VG .
Keywords: Microscopy -- Periodicals Microscopy Society of America Peter Crozier Peter Crozier Renu Sharma Renu Sharma Renu Sharma Miyoko Tanaka Miyoko Tanaka Magazines
See more books from our catalog: Science
Title: Microscopy and Microanalysis: Vol 4, #3, May/June 1998
Description: Springer, 1998. Magazine. Includes 1998 ASU Electron Microscopy Works. Some of the articles: Ion Beam Interface with a 200 keV Transmission electron Microscope for In Situ Micropatterning on Semicondutors; Time-Resolved High-Resolution Transmission Electron Microscopy using a Piezo-Driving Specimen Holder for Atomic-Scale; High Temp in Situ Strianing Experiments; Interphase Boundary Dynamics; Nanoparticle Sintering by Plan-View; Ostwarld Ripening of Germanium Island on Silicon; Melting of Aluminum Particles; Formation of nanocrystalline TiC from TiO2, etc. VG .
Keywords: Microscopy -- Periodicals Microscopy Society of America Peter Crozier Peter Crozier Renu Sharma Renu Sharma Renu Sharma Miyoko Tanaka Miyoko Tanaka Magazines
Price: US$ 10.00 Seller: Bookshop Baltimore
- Book number: 5280
- Book number: 5280
See more books from our catalog: Science