Chung, Deborah D. L. et. al.:
X-ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis.
New York, NY: VCH., 1993. VIII, 268 S., with numerous figures, Hardcover. As library copy in very good condition. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.
Antiquariat Thomas Haker
Professional sellerBook number: 832815
€ 38.00 [Appr.: US$ 41.39 | £UK 32 | JP¥ 6298]
Keywords: Kristall ; Dynamik ; Hochtemperatur ; Röntgenstrukturanalyse, Physik, Astronomie ISBN: 9783527278428