Author: BENOIT NADEAU-DOSTIE
Title: Design for at-Speed Test, Diagnosis and Measurement
Description: Kluwer Academic Publishers. 2000. Hard Cover. Hardcover/pub.2000/Gd. condition/238 pages- Design-For-Testability (DFT) is explained and demostrated. (H89755). Good.

Keywords: technology, programmer, layout, maintenance, business, software, chip, systems, how-to, instruction, computers


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