Ask a question or
Order this book


Browse our books
Search our books
Book dealer info



Title: The IEEE international workshop on Defect & Fault-Tolerance in VLSI Systems, Proceedings, 1995.
Description: Los Alamitos, IEEE Computer Society Press , 1995. 305 pp. hard cover. Illustrated in black and white. Sdescription VG. Slight shelf wear to covers, overall very good condition. No Jacket. ISBN: 0818671076.

Keywords: Fault-tolerant computing;  Integrated circuits, LCCN: 10636722, ISBN: 0818671076, ISSN: 10636722

Price: AUD 64.00 = appr. US$ 44.28 Seller: Lost and Found Books
- Book number: 13953

See more books from our catalog: engineering and technology