Author: IEEE Computer Society.
Title: The IEEE international workshop on Defect & Fault-Tolerance in VLSI Systems, Proceedings, 1995.
Description: Los Alamitos, IEEE Computer Society Press , 1995. 305 pp. hard cover. Illustrated in black and white. Sdescription VG. Slight shelf wear to covers, overall very good condition. No Jacket. ISBN: 0818671076.

Keywords: Fault-tolerant computing;  Integrated circuits, LCCN: 10636722, ISBN: 0818671076, ISSN: 10636722


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