![Beddow, John Keith (ed.). - Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ].](https://www.kerss.nl/home/pictures/77621.jpg)
Author: Beddow, John Keith (ed.).
Title: Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ].
Description: Boca Raton, Florida, CRC Press, Inc., 1985 2 vols. Original hardcovers. xviii,246 pp. & xviii,266 pp.; ills.; 26x18 cm. " Uniscience Series on Fine Particle Science and Technology " Text in English. - (trace of removed label on spines, stamp on endpapers, small signs of use) Although (very) good, see picture . Gewicht/Weight: 1820 grs.
Keywords:
Title: Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ].
Description: Boca Raton, Florida, CRC Press, Inc., 1985 2 vols. Original hardcovers. xviii,246 pp. & xviii,266 pp.; ills.; 26x18 cm. " Uniscience Series on Fine Particle Science and Technology " Text in English. - (trace of removed label on spines, stamp on endpapers, small signs of use) Although (very) good, see picture . Gewicht/Weight: 1820 grs.
Keywords:
Price: EUR 40.00 = appr. US$ 43.47 Seller: Boekhandel-Antiquariaat Emile Kerssemakers
- Book number: 77621
- Book number: 77621