Author: Bourgoin, J. and Lannoo, M.: Title: Point Defects in Semiconductors II. Experimental Aspects. Springer Series in Solid-State Sciences; Vol. 35.
Description: Berlin: Springer. 1983. 295 p., with numerous figures, Hardcover. Good condition. Ex-Library with usual markings. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.
Keywords: Physics ISBN: 9783540115151
Price: EUR 51.60 = appr. US$ 56.08 Seller: Antiquariat Thomas Haker
- Book number: 835876
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