Author: Bourgoin, J. and M. Lannoo: Title: Point defects in semiconductors II: Experimental Aspects. (=Springer series in solid-state sciences ; 35). With a Foreword by G. D. Watkins.
Description: Berlin, Springer 1983. 295 S.; Ill. Hardcover Ex.-Libr., Good condition. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.
Keywords: Punktdefekte, Halbleiter, Halbleiterphysik ISBN: 9783540115151
Price: EUR 44.10 = appr. US$ 47.93 Seller: Antiquariat Thomas Haker
- Book number: 834226
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