Author: Bhushan, B. a. o. (Edts.):
Title: Applied scanning probe methods. Part 9: Characterization. (=Nano Science and Technology; 9).
Description: Berlin, Springer 2008. LIX, 387 S. : Ill., graph. Darst. Hardcover Like new. Shrink wrapped. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.

Keywords: Nanowisssenschaft, Nanotechnologie, Physik ISBN: 9783540740827


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