Author: Wang, Zhong Lin: Title: Reflection Electron Microscopy and spectotrophy for surface analysis
Description: Cambridge University Press 2008. Revised ed. 460 S.; Ill. Paperback Like new. Shrink wrapped. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.
Keywords: Elektronenmikroskopie, Spektroskopie ISBN: 9780521017954
Price: EUR 14.70 = appr. US$ 15.98 Seller: Antiquariat Thomas Haker
- Book number: 812644
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