Author: Kelly, Joe and Michael Engelhardt: Title: Advanced Production Testing of RF, SoC, and SiP Devices.
Description: Artech House Publishers 2006. 1st ed. 301 S. Hardcover Like new. Shrink wrapped. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.
Keywords: Informatik, Fehlererkennung ISBN: 9781580537094
Price: EUR 32.10 = appr. US$ 34.89 Seller: Antiquariat Thomas Haker
- Book number: 811940
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