Author: Tsui, Frank F.
Title: LSI/VLSI Testability Design.
Description: McGraw-Hill New York, 1986. 701 S. Paperback/ broschiert Sehr guter Zustand/ very good Ex-Library. With ill. Free shipping within Germany. Shipping costs to EU-countries: 9.50 EUR, to non-EU-countries: 15.00 EUR.

Keywords: Integrated circuits Large scale integration Testing Very large scale integration ISBN: 0070653410


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