Author: Khare, Jitendra B./Maly, Wojciech Title: From Contamination to defects, faults and yield Loss. Simulation and Applications
Description: Kluwer Academic Publishers, 1996. - former library book in good condition - Einband: gebundene Bücher. 468
Keywords: Technik
Price: EUR 20.00 = appr. US$ 21.74 Seller: Celler Versandantiquariat
- Book number: 2g4862