Author: Bhattacharya, Debashis/ Hayes, John P.
Title: Hierarchical Modeling for VLSI Circuit Testing
Description: Kluwer, 1990. Verlag: Kluwer Verlag: Kluwer -former library book in good condition- Einband: gebundene Bücher. 460
Keywords: Technik
Title: Hierarchical Modeling for VLSI Circuit Testing
Description: Kluwer, 1990. Verlag: Kluwer Verlag: Kluwer -former library book in good condition- Einband: gebundene Bücher. 460
Keywords: Technik
Price: EUR 20.00 = appr. US$ 21.74 Seller: Celler Versandantiquariat
- Book number: 1p3039
- Book number: 1p3039