Author: YARMOLIK, V. N.; KACHAN, I. V.
Title: Self-Testing VLSI Design
Description: Amsterdam, Elsevier. 1993. (ISBN: 0444896406). hardcover. Used, No dust jacket, name from previous owner on FEP. Binding is very well preserved, though with very light instances of wear to surfaces (a cosmetic problem and not a functional one). Inside, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Very Good/No Dust Jacket.

Keywords: 0444896406


See more books from our catalog: Science - Electronics