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Robinson, Arthur L. - Soft X-Ray Spectromicroscopy: Materials Characterization on a Microscale

Title: Soft X-Ray Spectromicroscopy: Materials Characterization on a Microscale
Description: , Lawrence Berkeley National Laboratory, 1997. . Paperback. . Unmarked text. Back cover flap inside contains various loose papers that summarize the spectromicroscopy facilities of the Advanced Light Source (ALS) at the Lawrence Berkeley National Laboratory. Book offers an overview of synchrotron radiation, Spectroscopy and Spectromicroscopy at ALS. Bibliography. 46+pp.. . . Very Good

Keywords: Optics, X-ray, Physics, Astrophysics, Lawrence Berkeley National Laboratory, Synchrotron, ALS, Materials Science, Ephemera

Price: US$ 27.00 Seller: Diatrope Books
- Book number: 26602

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