- Characterization of High Tc Materials and Devices by Electron Microscopy.

Cambridge University Press, 2000. Hardcover, Pages: 406. No dust jacket. Fast Dispatch. Expedited UK Delivery Available. Excellent Customer Service. Bookbarn International Inventory #2826348 Used; Very Good. ISBN: 9780521554909.

GBP 9.83 [Appr.: EURO 11.5 US$ 13.19 | JP¥ 1962] Book number 2826348

To our regrets this title was recently sold. Please use the search function to find another copy.

Do you want to see

- more titles like this one?
- more from this bookseller?

Back to your search results