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- Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford: Papers Presented at ... on Designing for Yield, Oxford, 1-3 July 1987.

Crc Press, 1988. Edition: 1. Hardcover with dustjacket, Pages: 304. Fast Dispatch. Expedited UK Delivery Available. Excellent Customer Service. Bookbarn International Inventory #2582091 Used; Good. ISBN: 9780852743980.
GBP 9.79 [Appr.: EURO 11.5 US$ 13.07 | JP¥ 1937] Book number 2582091


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