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JHA, NIRAJ K.; KUNDU, SANDIP - Testing and Reliable Design of CMOS Circuits

Boston, MA, U. S. A. Kluwer Academic Publishers. 1990, First Edition. (ISBN: 0792390563). hardcover. Used, Printed boards, no jacket. Exterior a little worn, grubby; previous owner's name on FEP; contents otherwise clean, sound, bright. TPW. Very Good/No Dust Jacket.
GBP 14.65 [Appr.: EURO 17 US$ 19.73 | JP¥ 2916] Book number 248701

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